Development and testing of subpicosecond streak camera for soft x-ray measurements

Development and testing of subpicosecond streak camera for soft x-ray measurements

著者名:

Lebedev,V.B. ( BIFO Co.Ltd. )

掲載資料名:

23rd International Congress on High-Speed Photography and Photonics : 20-25 September, 1998, Moscow, Russia

シリーズ名:

Proceedings of SPIE - the International Society for Optical Engineering

シリーズ巻号:

3516

発行年:

1999

巻:

Part1

開始ページ:

74

終了ページ:

84

出版情報:

Bellingham, Wash.: SPIE - The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819429759 [0819429759]

言語:

英語

請求記号:

P63600/3516

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00018069
シリーズID:	PA00000029
会議名:	International Congress on High-Speed Photography and Photonics
回次:	1998 : 23rd
会議開催地:	Moscow, Russia
会議開催年:	1998.09.20-1998.09.25

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