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Captive flight test-based infrared validation of a hardware-in-the-loop simulation

著者名:
掲載資料名:
Technologies for synthetic environments : hardware-in-the-loop testing V : 24-26 April 2000, Orlando, [Florida] USA
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
4027
発行年:
2000
開始ページ:
292
終了ページ:
300
出版情報:
Bellingham, Wash.: SPIE - The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819436535 [0819436534]
言語:
英語
請求記号:
P63600/4027
資料種別:
国際会議録

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