Blank Cover Image

Atomic Force Microscope-Based Lithography of Titanium

著者名:
Gordon, A. E.
Litfin, D. D.
Hagedorn, M. S.
Chen, J.
Fayfield, R. T.
Higman, T. K.
さらに 1 件
掲載資料名:
Materials - fabrication and patterning at the nanoscale : Symposium held April 19-20, 1995, San Francisco, California, USA
シリーズ名:
Materials Research Society symposium proceedings
シリーズ巻号:
380
発行年:
1995
開始ページ:
125
出版情報:
Pittsburgh, PA: MRS - Materials Research Society
ISSN:
02729172
ISBN:
9781558992832 [1558992839]
言語:
英語
請求記号:
M23500/380
資料種別:
国際会議録

類似資料:

1 国際会議録 Light Emission and Domain Formation in Real-Space Transfer Devices

Higman K. T., Chen J., Hagedorn S. M., Fayfield T. R.

Plenum Press
7 国際会議録 Application of carbon nanotube probes in a critical dimension atomic force microscope

B. C. Park, J. Choi, S. J. Ahn, D. Kim, J. Lyou, R. Dixson, N. G. Orji, J. Fu, T. V. Vorburger

SPIE - The International Society of Optical Engineering
2 国際会議録 Atomic force microscope for small cantilevers

Schaffer,T.E., Viani,M., Walters,D.A., Drake,B., Runge,E.K., Cleveland,J.P., Wendman,M.A., Hansma,P.K.

SPIE-The International Society for Optical Engineering
8 国際会議録 Miniaturized atomic force microscope for planetary exploration

Gautsch, S., Staufer, U., Akiyama, T., de Rooij, N.F., Hidber, H.R., Tonin, A., Mueller, D., Howald, L., Niedermann, P.

ESA Publications Division
3 国際会議録 IMAGING SINGLE NACREOUS TABLETS WITH THE ATOMIC FORCE MICROSCOPE

Giles, R., Manne, S., Zaremba, C. M., Belcher, A., Mann, S., Morse, D. E., Stucky, G. D., Hansma, P. K.

MRS - Materials Research Society
9 国際会議録 ATOMIC FORCE MICROSCOPE DESIGNS AND APPLICATIONS

Bryant, P.J., Miller, R.G., Deeken, R.H., Pederson, M.A.

Materials Research Society
4 国際会議録 Nano-oxidation of semiconductor heterostructures with atomic force microscopes:technology and applications

Heinzel,T.M., Luscher,S., Fuhrer,A., Salis,G., Held,R., Ensslin,K., Wegscheider,W., Bichler,M.

SPIE - The International Society for Optical Engineering
10 国際会議録 Low Voltage E-Beam Lithography with the Scanning Tunneling Microscope

Marrian C. R. K., Perkins F. K., Brandow S. L., Koloski T. S., Dobisz E. A., Calvert J. M.

Kluwer Academic Publishers
5 国際会議録 Atomic Scale Force Mapping with the Atomic Force Microscope

Cleveland P. J., Radmacher M., Hansma K. P.

Kluwer Academic Publishers
11 国際会議録 STRUCTURE AND MORPHOLOGY OF Pd OVERLAYERS ON EPITAXIAL SnO2 FILMS STUDIED WITH THE ATOMIC FORCE MICROSCOPE

Lad, R.J., Matthews, M.J., Antonik, M.D., Cavicchi, R.E., Semancik, S.

Materials Research Society
6 国際会議録 Dynamic studies on living cells with an atomic force fluorescence microscope

Struckmeier,J., Klopp,E., Born,M., Rink,D., Tenbosch,J., Ecke,S., Butt,H.-J., Hofmann,M.R., Jones,D.B.

SPIE-The International Society for Optical Engineering
12 国際会議録 Measurement of Steric Exclusion Forces with the Atomic Force Microscope

Lea, A. S., Andrade, J. D., Hlady, V.

American Chemical Society
1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12