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Deep Trap Characterization in GaN Using Thermal and Optical Admittance Spectroscopy

著者名:
KrTschil, A.
Witte, H.
Lisker, M.
Christen, J.
Birkle, U.
Einfeldt, S.
Hommel, D.
Topf, M.
Meyer, B. K.
さらに 4 件
掲載資料名:
Nitride semiconductors : symposium held December 1-5, 1997, Boston, Massachusetts, U.S.A.
シリーズ名:
Materials Research Society symposium proceedings
シリーズ巻号:
482
発行年:
1998
開始ページ:
887
出版情報:
Warrendale, Pa.: MRS - Materials Research Society
ISSN:
02729172
ISBN:
9781558993877 [1558993878]
言語:
英語
請求記号:
M23500/482
資料種別:
国際会議録

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