Dark Current Reduction in Near Infrared p-i-n Detector Diodes Fabricated from In.75Ga.25As Grown by Molecular-Beam Epitaxy on InP Substrates
- 著者名:
Micovic, M. Cai, W. Z. Ren, Y. Neal, J. Nelson, S. F. Mayer, T. S. Miller, D. L. - 掲載資料名:
- Infrared applications of semiconductors - materials, processing, and devices : symposium held December 2-5, 1996, Boston, Massachusetts, U.S.A
- シリーズ名:
- Materials Research Society symposium proceedings
- シリーズ巻号:
- 450
- 発行年:
- 1997
- 開始ページ:
- 219
- 出版情報:
- Pittsburgh, Pa.: MRS - Materials Research Society
- ISSN:
- 02729172
- ISBN:
- 9781558993549 [1558993541]
- 言語:
- 英語
- 請求記号:
- M23500/450
- 資料種別:
- 国際会議録
類似資料:
SPIE-The International Society for Optical Engineering |
7
国際会議録
TEMPERATURE DEPENDENCE OF MORPHOLOGY OF InP FILMS GROWN BY METALORGANIC MOLECULAR BEAM EPITAXY
MRS - Materials Research Society |
Materials Research Society |
MRS - Materials Research Society |
Materials Research Society |
9
国際会議録
Molecular beam epitaxy grown long wavelength infrared HgCdTe on compliant Si substrates [6206-40]
SPIE - The International Society of Optical Engineering |
Materials Research Society |
Materials Research Society |
SPIE - The International Society for Optical Engineering |
Materials Research Society |
SPIE-The International Society for Optical Engineering |
SPIE - The International Society of Optical Engineering |