Life testing and failure analysis of GaN/AlGaN/InGaN light-emitting diodes
- 著者名:
- Osinski,M. ( Univ.of New Mexico )
- Barton,D.L.
- Helms,C.J.
- Berg,N.H.
- Perlin,P.
- 掲載資料名:
- Fabrication, testing, and reliability of semiconductor lasers II : 13-14 February, 1997, San Jose, California
- シリーズ名:
- Proceedings of SPIE - the International Society for Optical Engineering
- シリーズ巻号:
- 3004
- 発行年:
- 1997
- 開始ページ:
- 113
- 終了ページ:
- 120
- 出版情報:
- Bellingham, Washington: SPIE-The International Society for Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819424150 [0819424153]
- 言語:
- 英語
- 請求記号:
- P63600/3004
- 資料種別:
- 国際会議録
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10
国際会議録
Degradation of Single-Quantum-Well InGaN Green Light Emitting Diodes Under High Electrical Stress
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