Blank Cover Image

Optical properties of liquid metals studied by spectroscopic ellipsometry

著者名:
掲載資料名:
International Symposium on Polarization Analysis and Applications to Device Technology
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
2873
発行年:
1996
開始ページ:
314
終了ページ:
315
出版情報:
Bellingham, Wash.: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819422712 [0819422711]
言語:
英語
請求記号:
P63600/2873
資料種別:
国際会議録

類似資料:

1 国際会議録 Spectroscopic ellipsometry measurements with the Grating Division-of-Amplitude Photopolarimeter

Nordine, P.C., Hampton, D.S., Krishnan, S.

SPIE-The International Society for Optical Engineering
7 国際会議録 Monitoring optical properties and thickness of PECVD SiON antireflective layer by spectroscopic ellipsometry

Ygartua,C., Konjuh,K., Schuchmann,S., MacWilliams,K.P., Mordo,D.

SPIE-The International Society for Optical Engineering
2 国際会議録 Fast ellipsometry and Mueller matrix ellipsometry using the division-of-amplitude photopolarimeter

Krishnan,S., Nordine,P.C.

SPIE-The International Society for Optical Engineering
8 国際会議録 SUPERLATTICE OPTICAL PROPERTIES MEASURED BY VARIABLE ANGLE SPECTROSCOPIC ELLIPSOMETRY

Snyder, P. G., Merkel, K. G., De, B. N., Woollam, J. A., Langer, D. W., Stutz, C. E., Jones, R., Rai, A. K., Evans, K.

Materials Research Society
3 国際会議録 Containerless processing and property measurements of high temperature liquids and solids.

Weber, J. K. R., Schiffman, R. A., Krishnan, S., Nordine, P. C.

ESA Publications Division
9 国際会議録 Processing and Properties of Undercooled Molten Oxides

Weber, J.K.R., Felten, J.J., Cho, B., Nordine, P.C.

Electrochemical Society
4 国際会議録 Atomic Structure of High-Temperature Metallic and Ceramic Liquids

Krishnan, S., Ansell, S., Price, D.L., Felten, J.J., Weber, J.K.R., Nordine, P.C.

Electrochemical Society
10 国際会議録 Oxide superconductor interfaces studied by spectroscopic ellipsometry

Gibbons, B.J., Trolier-McKinstry, S., Schlom, D.G., Eom, C.B.

Materials Research Society
5 国際会議録 Optical Dielectric Response of Gallium Nitride Studied by Variable Angle Spectroscopic Ellipsometry

Yao, H., Yan, C. H., Jenkinson, H. A., Zavada, J. M., Speck, J. S., DenBaars, S. P.

MRS - Materials Research Society
11 国際会議録 Optical properties of ion-implanted laser-annealed Si studied by spectroscopic ellipsometry

Asai,K., Watanabe,K., Sameshima,T., Saitoh,T., Xiong,Y.-M.

SPIE-The International Society for Optical Engineering
6 国際会議録 Optical properties of AIN/sapphire grown at high and low temperatures studied by variable angle spectroscopic ellipsometry and micro Raman scattering

Yan,C.H., Yao,H.W., Abare,A.C., DenBaars,S.P., Klaassen,J.J., Rosamond,M.F., Chow,P.P., Zavada,J.M.

SPIE - The International Society for Optical Engineering
12 国際会議録 Optical properties of TiO2-x thin films studied by spectroscopic ellipsometry: substrate temperature effect

Camacho-Lopez, M. A., Sanchez-Perez, C. A., Esparza-Garcia, A., Ghibaudo, E., Rodil, S., Muhl, S., Escobar-Alarcon, L.

SPIE - The International Society of Optical Engineering
1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12