Detectability and printability of programmed defect reticle for 256-Mb dram
- 著者名:
- Park,J.H. ( Samsung Electronics Co.,Ltd. )
- Cho,H.-K.
- Kim,Y.-H.
- Lee,K.-H.
- Yoon,H.-S.
- 掲載資料名:
- Photomask and X-Ray Mask Technology III
- シリーズ名:
- Proceedings of SPIE - the International Society for Optical Engineering
- シリーズ巻号:
- 2793
- 発行年:
- 1996
- 開始ページ:
- 300
- 終了ページ:
- 311
- 出版情報:
- Bellingham, Wash.: SPIE-The International Society for Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819421791 [0819421790]
- 言語:
- 英語
- 請求記号:
- P63600/2793
- 資料種別:
- 国際会議録
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