Characterization of diamond thin films using transmission electron microscopy
- 著者名:
- Csencsits,R. ( Argonne National Lab. )
- Gruen,D.M.
- Krauss,A.R.
- Zuiker,C.D.
- 掲載資料名:
- Optical Engineering Midwest '95
- シリーズ名:
- Proceedings of SPIE - the International Society for Optical Engineering
- シリーズ巻号:
- 2622
- 発行年:
- 1995
- 巻:
- Part1
- 開始ページ:
- 405
- 終了ページ:
- 406
- 出版情報:
- Bellingham, Wash.: SPIE-The International Society for Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819419866 [0819419869]
- 言語:
- 英語
- 請求記号:
- P63600/2622
- 資料種別:
- 国際会議録
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