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Nondestructive Characterisation of MOVPE-Grown CdTe and ZnTe Epilayers by Picosecond and Nanosecond"Excite-Probe"Techniques

著者名:
Gaubas,E.
Mizeikis,V.
Bastiene,L.
Jarasiunas,K.
Lovergine,N.
Mancini,A.M.
Prete,P.
Subacius,L.
さらに 3 件
掲載資料名:
Ultrafast phenomena in semiconductors : proceedings of the 10th International Symposium on Ultrafast Phenomena in Semiconductors (10-UFPS), held in Vilnius, Lithuania, August/September, 1998
シリーズ名:
Materials science forum
シリーズ巻号:
297-298
発行年:
1999
開始ページ:
111
終了ページ:
114
出版情報:
Zurich-Uetikon, Switzerland: Trans Tech Publications
ISSN:
02555476
ISBN:
9780878498246 [0878498249]
言語:
英語
請求記号:
M23650
資料種別:
国際会議録

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