Characterization of the Mechanical Properties of Thin Film Cantilevers with the Atomic Force Microscope

Characterization of the Mechanical Properties of Thin Film Cantilevers with the Atomic Force Microscope

著者名:

掲載資料名:

Interfaces II : proceedings of the Second International Conference on the Roles of Interfaces in Advanced Materials Design, Processing and Performance, held at the Ballarat Village Conference Centre, Ballarat, Victoria, Australia, November 1-5, 1993

シリーズ名:

Materials science forum

シリーズ巻号:

189-190

発行年:

1995

開始ページ:

107

終了ページ:

114

出版情報:

Aedermannsdorf, Switzerland: Trans Tech Publications

ISSN:

02555476

ISBN:

9780878496938 [0878496939]

言語:

英語

請求記号:

M23650

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00017901
シリーズID:	PA00000012
会議名:	International Conference on the Roles of Interfaces in Advanced Materials Design, Processing and Performance
回次:	2nd
会議開催地:	Ballarat, Victoria, Australia
会議開催年:	1993.11.01-1993.11.05

類似資料:

1 国際会議録 Atomic force microscope for small cantilevers Schaffer,T.E., Viani,M., Walters,D.A., Drake,B., Runge,E.K., Cleveland,J.P., Wendman,M.A., Hansma,P.K. SPIE-The International Society for Optical Engineering	7 国際会議録 MEASURING THE STRENGTH AND STIFFNESS OF THIN FILM MATERIAL BY MECHANICALLY DEFLECTING CANTILEVER MICROBEAMS Weihs, T.P., Hong, S., Bravman, J.C., Nix, W.D. Materials Research Society
2 国際会議録 Fabrication of polymer cantilevers for force-controlled atomic force microscope Kato, N., Park, C. S., Matsumoto, T., Kikuta, H., Iwata, K. SPIE-The International Society for Optical Engineering	8 国際会議録 GROWTH AND SURFACE MORPHOLOGY OF THIN SILICON FILMS USING AN ATOMIC FORCE MICROSCOPE Hegde, Rama I., Chonko, Mark A., Tobin, Philip J. Materials Research Society
3 国際会議録 Imaging the microstructure of copper with the atomic force microscope (AFM) and ultrasonic force microscope (UFM) Druffner, C.J., Schumaker, E.J., Murray, P.T., Sathish, S. SPIE-The International Society for Optical Engineering	9 国際会議録 GROWTH AND SURFACE MORPHOLOGY OF THIN SILICON FILMS USING AN ATOMIC FORCE MICROSCOPE Hegde, Rama I., Chonko, Mark A., Tobin, Philip J. Materials Research Society
4 国際会議録 DUCTILITY ENHANCEMENT AND MECHANICAL PROPERTIES OF IBAD CERAMIC THIN FILMS Hirvonen, J.K., Tetreault, T.G., Parker, G., McHargue, C.J. Materials Research Society	10 国際会議録 The Quality of Thin Silicon Films Determined by an Atomic Force Microscope (AFM) R.I. Hegde, M.A. Chanko, P.J. Tobin Electrochemical Society
5 国際会議録 Mechanical Characterization of Hepatoma Cells Using Atomic Force Microscope J.H. Wang, M. Yu, L. Liu, J. Zhao, H.X. Wang Trans Tech Publications	11 国際会議録 Direct three-dimensional nanoscale thermal lithography at high speeds using heated atomic-force microscope cantilevers Y. Hua, S. Saxena, J. C. Lee, W. P. King, C. L. Henderson SPIE - The International Society of Optical Engineering
6 国際会議録 An x-ray tomography facility for quantitative prediction of mechanical and transport properties in geological, biological, and synthetic systems Sakellariou, A., Senden, T.J., Sawkins, T.J., Knackstedt, M.A., Turner, M.L., Jones, A.C., Saadatfar, M., Roberts, R.J., … SPIE - The International Society of Optical Engineering	12 国際会議録 Finite element simulations of nonlinear vibrations of atomic force microscope cantilevers Shen, K., Turner, J.A. SPIE-The International Society for Optical Engineering

1

2

3

4

5

6

7

8

9

10

11

12