Blank Cover Image

Pressure Dependence of the DX Center in Al0.35Ga0.65As:Te

著者名:
Li,M.F.
Shan,W.
Yu,P.Y.
Hansen,W.L.
Weber,E.R.
Bauser,E.
さらに 1 件
掲載資料名:
Proceedings of the 15th International Conference on Defects in Semiconductors : Budapest, Hungary, August 22-26, 1988
シリーズ名:
Materials science forum
シリーズ巻号:
38-41
発行年:
1989
巻:
Part3
開始ページ:
1103
終了ページ:
1108
出版情報:
Aederlmannsdorf, Switzwelns: Trans Tech Publications
ISSN:
02555476
ISBN:
9780878495849 [0878495843]
言語:
英語
請求記号:
M23650
資料種別:
国際会議録

類似資料:

Li,M.F., Yu,P.Y., Shan,W., Hansen,W.L., Weber,E.R.

Trans Tech Publications

Li,M.-F., Yu,P.Y., Weber,E.R., Bauser,E., Hansen,W.L., Haller,E.E.

Trans Tech Publications

Umana-Membreno, G.A., Dell, J.M., Parish, G., Nener, B.D., Faraone, L., Ventury, R., Mishra, U.K.

SPIE - The International Society of Optical Engineering

Li, M. F., Shan, W., Yu, P. Y., Hansen, W. L., Weber, E. R., Bauser, E.

Materials Research Society

Schneider, Th., Wagner, S. F., Menesklou, W., Ivers-Tiffee, E.

Materials Research Society

Shan,W., Li,M.F., Yu,P.Y., Walukiewicz,W., Hansen,W.L.

Trans Tech Publications

Borca, C. N., Dowben, P. A., Dulli, H., Liou, S. H., Liu, M. T., Liu, Y., Xu, Q. L.

Materials Research Society

Zhang,D., Ma,W., Wang,X., Chen,Z., Xu,D., Zheng,P., Huang,M., Zhang,M., Li,Z.

SPIE - The International Society for Optical Engineering

Andreev, Yu.M., Geiko, P.P., Badikov, V.V., Panyutin, V.L., Shevyrdayeva, G.S., Ivaschenko, M.V., Karapuzikov, A.I., …

SPIE-The International Society for Optical Engineering

Spector,M., Pfeiffer,L.N., Licini,J.C., West,K.W., Baraff,G.A.

Trans Tech Publications

Alexander W. G. M., Nido M., Ruhle W. W., Kohler K.

Plenum Press

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12