Effects of thermal annealing on ion-beam-sputtered SiO2 and TiO2 optical thin films
- 著者名:
- Tilsch,M. ( Technische Hochschule Darmstadt (FRG) )
- Scheuer,V. ( Technische Hochschule Darmstadt (FRG) )
- Tschudi,T.T. ( Technische Hochschule Darmstadt (FRG) )
- 掲載資料名:
- Optical thin films V : new developments : 30 July-1 August 1997, San Diego, California
- シリーズ名:
- Proceedings of SPIE - the International Society for Optical Engineering
- シリーズ巻号:
- 3133
- 発行年:
- 1997
- 開始ページ:
- 163
- 終了ページ:
- 175
- 出版情報:
- Bellingham, Wash.: SPIE-The International Society for Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819425553 [0819425559]
- 言語:
- 英語
- 請求記号:
- P63600/3133
- 資料種別:
- 国際会議録
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