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Improvement of overlay in the oxide- and W-chemical-mechanical polish processes

著者名:
Yang,S.-S. ( World-Wide Semiconductor Manufacturing Corp. (Taiwan) )  
掲載資料名:
Optical microlithography XI : 25-27 February 1998, Santa Clara, California
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
3334
発行年:
1998
開始ページ:
978
終了ページ:
985
出版情報:
Bellingham, Wash., USA: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819427793 [0819427799]
言語:
英語
請求記号:
P63600/3334
資料種別:
国際会議録

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