Superresolved imaging sensors with field-of-view preservation

Superresolved imaging sensors with field-of-view preservation

著者名:

Reynolds,W.R. ( Signature Research,Inc. )
Hilgers,J.W. ( Signature Research,Inc. )
Schulz,T.J. ( Michigan Technological Univ. )
Amphay,S.A. ( Air Force Research Lab. )

掲載資料名:

Passive millimeter-wave imaging technology II : 13 April 1998, Orlando, Florida

シリーズ名:

Proceedings of SPIE - the International Society for Optical Engineering

シリーズ巻号:

3378

発行年:

1998

開始ページ:

134

終了ページ:

147

出版情報:

Bellingham, Wash., USA: SPIE-The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819428271 [0819428272]

言語:

英語

請求記号:

P63600/3378

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00017851
シリーズID:	PA00000029
会議名:	Defense, Security, and Sensing : Passive Millimeter-Wave Imaging Technology
回次:	1998 : 2nd
会議開催地:	Orlando, FL, USA
会議開催年:	1998.04.13

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