Blank Cover Image

Optical Constants of Thin CVD-Tungsten Oxide Films

著者名:
掲載資料名:
OPTIKA '98, 14-17 September 1998, Budapest, Hungary
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
3573
発行年:
1998
開始ページ:
200
終了ページ:
203
出版情報:
Bellingham, WA: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819430380 [0819430382]
言語:
英語
請求記号:
P63600/3573
資料種別:
国際会議録

類似資料:

1 国際会議録 Surface Characterization Of Chromium Oxide Thin Films in Dependence on CVD Growth Process Parameters

K.A. Gesheva, T. Ivanova, A.M. Szekeres, O. Trofimov

Electrochemical Society
7 国際会議録 Lithium insertion in tungsten oxide thin films

Lee,S.-H., Seong,M.J., Ozcan,E., Tracy,C.E., Tepehan,F.Z., Deb,S.K.

SPIE-The International Society for Optical Engineering
2 国際会議録 Photo-induced changes of the optical constants of chalcodenide Ge19Sb1Te80 films

Pamukchieva, V., Szekeres, A. M., Todorova, K.

SPIE - The International Society of Optical Engineering
8 国際会議録 Optical properties of crystalline tungsten oxide

Hutchins,M.G., Topping,A.J., Butt,N., Jeffrey,D., Brotherston,I.D., Milne,P.E.Y., Gallego,J.M., Owen,J.R.

SPIE-The International Society for Optical Engineering
3 国際会議録 Optical Absorption in APCVD Metal Oxide Thin Films

Gesheva, K.A., Ivanova, T., Szekeres, A.

Kluwer Academic Publishers
9 国際会議録 Effect of technical parameter on optical constants of amorphous silicon thin film

S.-B. Li, Z.-M. Wu, K.-P. Zhu, Y.-D. Jiang, W. Li

Society of Photo-optical Instrumentation Engineers
4 国際会議録 Preparation of WSi2 by RTA Annealing of CVD-W Thin Films

Gesheva, K. A., Stoyanov, G. I., Gogova, D. S., Beshkov, G. D.

MRS - Materials Research Society
10 国際会議録 Normal Incidence Reflectance: A Robust Tool for In Situ Real-Time Measurement of Growth Rates and Optical Constants of CVD-Grown Semiconductor Thin Films

Breiland, W.G., Brennan, T.M., Chui, H.C., Hammons, B.E., Killeen, K.P.

Electrochemical Society
5 国際会議録 WD3:Examination of tungsten-oxide-based thin films for optical memory

Bussjager,R.J., Osman,J.M., Chaiken,J., Getbehead,M.A., Hinkel,D.S., McEwen,T.

SPIE - The International Society for Optical Engineering
11 国際会議録 Determination of the optical constants and thickness of titanium oxide thin film by envelope method

N. Witit-anun, P. Rokkwamsuk, P. Limsuwan

Society of Photo-optical Instrumentation Engineers
6 国際会議録 Optical constants of thin-film gallium sulfide layers

Jenkins,P., Tuma,M.L., Naghski,D.H., Maclnnes,A.

SPIE-The International Society for Optical Engineering
12 国際会議録 Electrochromic tungsten oxide multilayer thin films for use in smart windows

Cui, H.N., Costa, M.F.M., Teixeira, V.M., Porqueras, I., Bertran, E.

SPIE - The International Society of Optical Engineering
1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12