Application of digital speckle photography for local strain analysis
- 著者名:
- Holstein,D. ( Bremer Institut fur Angewandte Strahltechnik )
- Theiler,C.
- Hartmann,H.-J.
- Juptner,W.P.
- 掲載資料名:
- Optical measurement systems for industrial inspection : 16-17 June 1999, Munich, Germany
- シリーズ名:
- Proceedings of SPIE - the International Society for Optical Engineering
- シリーズ巻号:
- 3824
- 発行年:
- 1999
- 開始ページ:
- 229
- 終了ページ:
- 236
- 出版情報:
- Bellingham, Wash.: SPIE - The International Society for Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819433107 [0819433101]
- 言語:
- 英語
- 請求記号:
- P63600/3824
- 資料種別:
- 国際会議録
類似資料:
SPIE-The International Society for Optical Engineering |
SPIE--International Society for Optical Engineering |
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Society of Photo-optical Instrumentation Engineers |
SPIE-The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
SPIE - The International Society for Optical Engineering |
SPIE - The International Society of Optical Engineering |
SPIE - The International Society for Optical Engineering |
SPIE - The International Society of Optical Engineering |
SPIE-The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |