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Shape measurement by multiple-wavelength interferometry

著者名:
掲載資料名:
Optical measurement systems for industrial inspection : 16-17 June 1999, Munich, Germany
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
3824
発行年:
1999
開始ページ:
72
終了ページ:
78
出版情報:
Bellingham, Wash.: SPIE - The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819433107 [0819433101]
言語:
英語
請求記号:
P63600/3824
資料種別:
国際会議録

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