Optical figure testing by scanning deflectometry
- 著者名:
- Amstel,W.D.van ( Philips Ctr. For Manufacturing Technology )
- Baumer,S.M.B.
- Horijon,J.L.
- 掲載資料名:
- Optical Manufacturing and Testing III
- シリーズ名:
- Proceedings of SPIE - the International Society for Optical Engineering
- シリーズ巻号:
- 3782
- 発行年:
- 1999
- 開始ページ:
- 320
- 終了ページ:
- 327
- 出版情報:
- Bellingham, Wash.: SPIE - The International Society for Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819432681 [0819432687]
- 言語:
- 英語
- 請求記号:
- P63600/3782
- 資料種別:
- 国際会議録
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