Blank Cover Image

Fizeau confocal laser scanning interference microscope

著者名:
掲載資料名:
Selected papers from International Conference on Optics and Optoelectronics '98 : Silber Jubilee Symposium of the Optical Society of India : 9-12 December 1998, Dehradun, India
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
3729
発行年:
1999
開始ページ:
384
終了ページ:
389
出版情報:
Bellingham, Wash., USA: SPIE - The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819432032 [0819432032]
言語:
英語
請求記号:
P63600/3729
資料種別:
国際会議録

類似資料:

Meilan,P.F., Garavaglia,M.

SPIE-The International Society for Optical Engineering

Meilan, P.F., Laquidara, A.P., Garavaglia, M.

SPIE - The International Society of Optical Engineering

Creus,M.F., Alvarez, Guillermo,A.M., Meilan,P.F., Garavaglia,M., Gallego-Lluesma,E.

SPIE-The International Society for Optical Engineering

Meilan,P.F., Zalvidea,D., Garavaglia,M.

SPIE-The International Society for Optical Engineering

Ribes, A. C., Damaskinos, S., Tiedje, H. F., Dixon, A. E., Brodie, D. E., Duttagupta, S. P., Fauchet, P. M.

MRS - Materials Research Society

Dertinger, T., Koberling, F., Benda, A., Erdmann, R., Hof, M., Enderlein, J.

SPIE - The International Society of Optical Engineering

Anderson, J. R., Barrett, S. F., Wilcox, M. J.

SPIE - The International Society of Optical Engineering

Meilan,P.F., Garavalia,M.

SPIE-The International Society for Optical Engineering

Diaspro,A., Pellistri,F., Federici,F., Gerbi,A., Ramoino,P., Robello,M.

SPIE-The International Society for Optical Engineering

Beghuin, D., VandeVen, M., Ameloot, M., Claessens, D., Van Oostveldt, P.

SPIE - The International Society of Optical Engineering

C.-H. Chang, C. Chou, H.-F. Chang, H.-F. Yau, H.-J. Huang, W.-C. Kuo

SPIE - The International Society of Optical Engineering

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12