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Collective effects in resonant negative ion photodetachment

著者名:
掲載資料名:
International Workshop on Nondestructive Testing and Computer Simulations in Science and Engineering : 8-12 June 1998, St. Petersburg, Russia
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
3687
発行年:
1999
開始ページ:
90
終了ページ:
101
出版情報:
Bellingham, Wash.: SPIE - The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819431615 [0819431613]
言語:
英語
請求記号:
P63600/3687
資料種別:
国際会議録

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