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Near-field scanning optical microscopy probes for high-resolution beam scans of near-infrared lasers and waveguides

著者名:
掲載資料名:
Applications of photonic technology 3 : closing the gap between theory, development, and application
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
3491
発行年:
1998
開始ページ:
842
終了ページ:
847
出版情報:
Bellingham, Wash.: SPIE - The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819429506 [0819429503]
言語:
英語
請求記号:
P63600/3491
資料種別:
国際会議録

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