Blank Cover Image

PHOTOLUMINESCENCE STUDY OF HYDROGEN-RELATED DEFECTS IN SILICON

著者名:
掲載資料名:
Diagnostic techniques for semiconductor materials processing : Symposium held November 29-December 2, 1993, Boston, Massachusetts, U.S.A.
シリーズ名:
Materials Research Society symposium proceedings
シリーズ巻号:
324
発行年:
1994
開始ページ:
261
出版情報:
Pittsburgh: MRS - Materials Research Society
ISSN:
02729172
ISBN:
9781558992238 [1558992235]
言語:
英語
請求記号:
M23500/324
資料種別:
国際会議録

類似資料:

1 国際会議録 A New Photoluminescent Center in Mercury-Doped Silicon

Henry,A., Monemar,B., Bergman,J.P., Lindstrom,J.L., Zhang,Y., Corbett,J.W.

Trans Tech Publications
7 国際会議録 Magnetic resonance from a metastable sulfur-pair-related complex defect in silicon

Chen,W.M., Singh,M., Henry,A., Janzen,E., Monemar,B., Frens,A.M., Bennebroek,M.T., Schmidt,J., Reeson,K.J., …

Trans Tech Publications
2 国際会議録 OPTICALLY DETECTED MAGNETIC RESONANCE OF A HYDROGEN-RELATED COMPLEX DEFECT IN SILICON

Chen, W.M., Awadelkarim, O.O., Monemar, B., Lindstrom, J.L., Oehrlein, G.S.

Materials Research Society
8 国際会議録 A deep photoluminescence band in 4H SiC related to the silicon vacancy

Sorman,E., Son,N.T., Chen,W.M., Hallin,C., Lindstrom,J.L., Janzen,E.

Trans Tech Publications
3 国際会議録 DEFECT-FORMATION DEPENDENCE ON GROUP V-DOPANT ATOMS IN ELECTRON-IRRADIATED SILICON

Awadelkarim, O.O., Henry, A., Monemar, B., Lindstrom, J.L.

Materials Research Society
9 国際会議録 The Configurational Change of a Metastable S-Cu Defect in Silicon

Chen,W.M., Janzen,E., Monemar,B., Henry,A., Frens,A.M., Bennebroek,M.T., Schmidt,J.

Trans Tech Publications
4 国際会議録 SF6/O2 and CF4/O2 Reactive-Ion-Etching-Induced Defects in Silicon Studied by Photoluminescence Spectroscopy:Role of Oxygen

Buyanova,I.A., Henry,A., Monemar,B., Lindstrom,J.L., Sheinkman,M.K., Oehrlein,G.S.

Trans Tech Publications
10 国際会議録 ELECTRONIC STRUCTURE OF TWO SULPHUR-RELATED BOUND EXCITONS IN SILICON STUDIED BY OPTICAL DETECTION OF MAGNETIC RESONANCE

Chen, W.M., Henry, A., Janzen, E., Monemar, B., Thewalt, M.L.W.

Materials Research Society
5 国際会議録 Characterization of Defects Created in Silicon Due to Etching in Low-Pressure Plasmas Containing Fluorine and Oxygen

Buyanova, I. A., Henry, A., Monemar, B., Lindstrom, J. L., Lamprecht, A., Svensson, B. G., Oehrlein, G. S.

MRS - Materials Research Society
11 国際会議録 A Metastable Selenium-Related Center in Silicon

Henry,A., Sorman,E., Andersson,S., Chen,W.M., Monemar,B., Janzen,E.

Trans Tech Publications
6 国際会議録 Observation of Rapid Direct Charge Transfer between Deep Defects in Silicon

Frens,A.M., Bennebroek,M.T., Zakrzewski,A., Schmidt,J., Chen,W.M., Janzen,E., Lindstrom,J.L., Monemar,B.

Trans Tech Publications
12 国際会議録 *HYDROGEN IN SILICON

Corbett, J. W., Lindstorm, J. L., Pearton, S. J.

Materials Research Society
1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12