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PHOTOREFLECTANCE CHARACTERIZATION OF ETCH-INDUCED DAMAGE IN DRY ETCHED GaAs

著者名:
Glembocki, O. J.
Tuchman, J. A.
Ko, K. K.
Pang, S. W.
Giordana, A.
Stutz, C. E.
さらに 1 件
掲載資料名:
Diagnostic techniques for semiconductor materials processing : Symposium held November 29-December 2, 1993, Boston, Massachusetts, U.S.A.
シリーズ名:
Materials Research Society symposium proceedings
シリーズ巻号:
324
発行年:
1994
開始ページ:
153
出版情報:
Pittsburgh: MRS - Materials Research Society
ISSN:
02729172
ISBN:
9781558992238 [1558992235]
言語:
英語
請求記号:
M23500/324
資料種別:
国際会議録

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