Thermal Mismatch Strain Relaxation Mechanisms and Hysteresis in Pb1-xSnxSe-on-CaF2/Si Structures
- 著者名:
Zogg, H. Muller, P. Fach, A. John, J. Paglino, C. Teodoropol, S. - 掲載資料名:
- Strained layer epitaxy - materials processing and device applications : symposium held April 17-19, 1995, San Francisco, California, U.S.A.
- シリーズ名:
- Materials Research Society symposium proceedings
- シリーズ巻号:
- 379
- 発行年:
- 1995
- 開始ページ:
- 27
- 出版情報:
- Pittsburgh, PA: MRS - Materials Research Society
- ISSN:
- 02729172
- ISBN:
- 9781558992825 [1558992820]
- 言語:
- 英語
- 請求記号:
- M23500/379
- 資料種別:
- 国際会議録
類似資料:
Society of Photo-optical Instrumentation Engineers |
Materials Research Society |
SPIE-The International Society for Optical Engineering |
MRS - Materials Research Society |
SPIE-The International Society for Optical Engineering |
Materials Research Society |
Materials Research Society |
Kluwer Academic Publishers |
Materials Research Society |
MRS - Materials Research Society |
Society of Photo-optical Instrumentation Engineers |
Materials Research Society |