Structural Disorder and Localized Gap States in Silicon Grain Boundaries From a Tight-Binding Model

Structural Disorder and Localized Gap States in Silicon Grain Boundaries From a Tight-Binding Model

著者名:

掲載資料名:

Tight-binding approach to computational materials science : symposium held December 1-3, 1997, Boston, Massachusetts, U.S.A.

シリーズ名:

Materials Research Society symposium proceedings

シリーズ巻号:

491

発行年:

1998

開始ページ:

513

出版情報:

Warrendale, Pa.: MRS - Materials Research Society

ISSN:

02729172

ISBN:

9781558993969 [1558993967]

言語:

英語

請求記号:

M23500/491

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00017527
シリーズID:	PA00000011
会議名:	Symposium on tight-binding approach to computational materials science
回次:	1997
会議開催地:	Boston, MA, USA
会議開催年:	1997.12.01-1997.12.03

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