Joint AXAF high-resolution mirror assembly and AXAF CCD imaging spectrometer calibration at the MSFC X-ray calibration facility
- 著者名:
Nousek, J. ( The Pennsylvania State University ) Townsley, L. Chartas, G. Burrows, D. Moskalenko, E. Sambruna, R. Pesce, J. Grant, C. Nishikida, K. Cawley, L. Broos, P. Koch, T.S. Garmire, A. Garmire, G. Bautz, M. Jones, S. LaMarr, B. Ricker, G. - 掲載資料名:
- X-ray optics, instruments, and missions : 19-22 July 1998, San Diego, California
- シリーズ名:
- Proceedings of SPIE - the International Society for Optical Engineering
- シリーズ巻号:
- 3444
- 発行年:
- 1998
- 開始ページ:
- 225
- 終了ページ:
- 233
- 出版情報:
- Bellingham, Wash.: SPIE
- ISSN:
- 0277786X
- ISBN:
- 9780819428998 [081942899X]
- 言語:
- 英語
- 請求記号:
- P63600/3444
- 資料種別:
- 国際会議録
類似資料:
SPIE-The International Society for Optical Engineering | |
SPIE-The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering | |
SPIE-The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
SPIE - The International Society for Optical Engineering |
11
国際会議録
A charge-transfer-inefficiency correction model for the Chandra advanced-CCD imaging spectrometer
SPIE - The International Society of Optical Engineering |
Society of Photo-optical Instrumentation Engineers |
SPIE-The International Society for Optical Engineering |