Using advanced diagnostics to detect subsurface damage in sapphire

著者名:

Black,D.R. ( National Institute of Standards and Technology )

Braun,L.M. ( National Institute of Standards and Technology )

Burdette,H. ( National Institute of Standards and Technology )

Evans,C.J. ( National Institute of Standards and Technology )

Hockey,B.J. ( National Institute of Standards and Technology )

Polvani,R.S. ( National Institute of Standards and Technology )

White,G.S. ( National Institute of Standards and Technology )

さらに 2 件

掲載資料名:

Optical manufacturing and testing II : 27-29 July 1997, San Diego, California

シリーズ名:

Proceedings of SPIE - the International Society for Optical Engineering

シリーズ巻号:

3134

発行年:

1997

開始ページ:

272

終了ページ:

283

出版情報:

Bellingham, Wash.: SPIE-The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819425560 [0819425567]

言語:

英語

請求記号:

P63600/3134

資料種別:

国際会議録