Full-fieid surface profiling using dynamic projected grids

Full-fieid surface profiling using dynamic projected grids

著者名:: Beeson,R.J. ( Southwest Research Institute )
掲載資料名:: Three-Dimensional Imaging and Laser-based Systems for Metrology and Inspection III
シリーズ名:: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:: 3204
発行年:: 1997
開始ページ:: 68
終了ページ:: 73
出版情報:: Bellingham, Wash.: SPIE-The International Society for Optical Engineering
ISSN:: 0277786X
ISBN:: 9780819426369 [0819426369]
言語:: 英語
請求記号:: P63600/3204
資料種別:: 国際会議録

詳細

TDL書誌ID:	ZA00017399
シリーズID:	PA00000029
会議名:	Intelligent Systems and Advanced Manufacturing : Three-Dimensional Imaging,and Laser-based Systems for Metrology and Inspection
回次:	1997 : 3rd
会議開催地:	Piitsburgh, PA, USA
会議開催年:	1997.10.14-1997.10.15

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