Damage mechanisms of pico- and femtosecond laser retinal lesions as viewed by electron microscopy

Damage mechanisms of pico- and femtosecond laser retinal lesions as viewed by electron microscopy

著者名:

Toth,C.A. ( Duke Univ.Medical Ctr. )
Chiu,E.K. ( Duke Univ.Medical Ctr. )
Jumper,J.M. ( Duke Univ.Medical Ctr. )
Rockwell,B.A. ( Air Force Research Lab. )

掲載資料名:

Proceedings of applications of ultrashort-pulse lasers in medicine and biology : 29-30 January 1998, San Jose, California

シリーズ名:

Proceedings of SPIE - the International Society for Optical Engineering

シリーズ巻号:

3255

発行年:

1998

開始ページ:

77

終了ページ:

81

出版情報:

Bellingham, Wash.: SPIE-The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819426949 [0819426946]

言語:

英語

請求記号:

P63600/3255

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00017394
シリーズID:	PA00000029
会議名:	SPIE BiOS : Applications of ultrashort-pulse lasers in medicine and biology
回次:	1998
会議開催地:	San Jose, CA, USA
会議開催年:	1998.01.29-1998.01.30

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