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Near-field optical characterization of visible multiple quantum well semiconductor lasers

著者名:
Lu,N.H. ( Institute of Physics (Taiwan) )
Tsai,D.P. ( National Chung Cheng Univ.(Taiwan) )
Yeh,F.C. ( Institute of Physics (Taiwan) )
Chang,C.S. ( Institute of Physics (Taiwan) )
Tsong,T.T. ( Institute of Physics (Taiwan) )
Huang,M.F. ( Industrial Technology Research Institute (Taiwan) )
Liu,C.J. ( Industrial Technology Research Institute (Taiwan) )
さらに 2 件
掲載資料名:
Fabrication, testing, and reliability of semiconductor lasers III : 29-30 January, 1998, San Jose, California
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
3285
発行年:
1998
開始ページ:
59
終了ページ:
65
出版情報:
Bellingham, Washington: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819427243 [0819427241]
言語:
英語
請求記号:
P63600/3285
資料種別:
国際会議録

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