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Residual stress characterization of welds and post-weld processes using x-ray diffraction techniques

著者名:
掲載資料名:
Process control and sensors for manufacturing : 31 March - 1 April 1998, San Antonio, Texas
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
3399
発行年:
1998
開始ページ:
196
終了ページ:
204
出版情報:
Bellingham, Wash.: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819428486 [0819428485]
言語:
英語
請求記号:
P63600/3399
資料種別:
国際会議録

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