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Evaluation of cross sections of rare-earth ions in glass

著者名:
掲載資料名:
Rare-earth-doped materials and devices IV : 26-27 January 2000, San Jose, California
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
3942
発行年:
2000
開始ページ:
261
終了ページ:
266
出版情報:
Bellingham, Washington: SPIE - The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819435590 [0819435597]
言語:
英語
請求記号:
P63600/3942
資料種別:
国際会議録

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