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Mode study of the light emission distribution in semiconductor microdisks by using near-field optical microscopy

著者名:
Zhang,Y. ( Peking Univ. )
Zhu,X.
Dai,L.
Zhou,H.
Wang,R.
Xin,Y.
Wang,G.
Xu,S.
Shen,Y.
Zhang,B.
Zhang,G.
Gan,Z.
Song,F.
さらに 8 件
掲載資料名:
Near-field optics : physics, devices, and information processing : 22-23 July 1999, Denver, Colorado
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
3791
発行年:
1999
開始ページ:
168
終了ページ:
178
出版情報:
Bellingham, Wash.: SPIE - The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819432773 [0819432776]
言語:
英語
請求記号:
P63600/3791
資料種別:
国際会議録

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