Transmission Electron Microscopy Study of InGaAs/GaAs Structural Evolution Near the Stranski-Krastanow Transformation
- 著者名:
Wellman, J. George, T. Leon, R. Fafard, S. Zou, J. Cockayne, D. J. H. - 掲載資料名:
- Epitaxial growth - principles and applications : symposium held April 5-8, 1999, San Francisco, California, U.S.A.
- シリーズ名:
- Materials Research Society symposium proceedings
- シリーズ巻号:
- 570
- 発行年:
- 1999
- 開始ページ:
- 175
- 出版情報:
- Warrendale, PA: MRS - Materials Research Society
- ISSN:
- 02729172
- ISBN:
- 9781558994775 [1558994777]
- 言語:
- 英語
- 請求記号:
- M23500/570
- 資料種別:
- 国際会議録
類似資料:
Materials Research Society |
SPIE-The International Society for Optical Engineering |
Materials Research Society |
8
国際会議録
LIGHT SCATTERING STUDY OF THE EVOLUTION OF THE SURFACE MORPHOLOGY DURING GROWTH OF InGaAs ON GaAs
MRS - Materials Research Society |
SPIE-The International Society for Optical Engineering |
Materials Research Society |
Materials Research Society |
Trans Tech Publications |
Materials Research Society | |
MRS - Materials Research Society |
Materials Research Society |