Blank Cover Image

Injection-Level Spectroscopy of Metal Impurities in Silicon

著者名:
掲載資料名:
Defect and impurity engineered semiconductors, II : symposium held April 13-17, 1998, San Francisco, California, U.S.A.
シリーズ名:
Materials Research Society symposium proceedings
シリーズ巻号:
510
発行年:
1998
開始ページ:
575
出版情報:
Warrendale, Pa: MRS - Materials Research Society
ISSN:
02729172
ISBN:
9781558994164 [1558994165]
言語:
英語
請求記号:
M23500/510
資料種別:
国際会議録

類似資料:

1 国際会議録 Measurement of the Temperature Dependence of Silicon Recombination Lifetimes

Johnston, S., Ahrenkiel, R. K.

MRS - Materials Research Society
7 国際会議録 Symmetry Determinations by Vibrational Spectroscopy

Durig R. J., Johnston A. S.

D. Reidel Pub. Co.
2 国際会議録 Steady-state and Time-resolved Photoconductivity Measurements of Minority Carrier Lifetime in ZnTe

Bose,D.N., Johnston,S., Ahrenkiel,R.K., Bhunia,S.

SPIE - The International Society for Optical Engineering
8 国際会議録 THEORETICAL INVESTIGATION OF DEEP LEVEL COMPLEXES RELATED TO CARBON AND OXYGEN IMPURITIES IN SILICON.

GOMES,V.M.S., LEITE,J.R.

Trans Tech Publications
3 国際会議録 *Photoconductive properties of GaAs1-xNx double heterostructures as a function of excitation wavelength

Ahrenkiel, R. K., Mascarenhas, A., Johnston, S. W., Zhang, Y., Friedman, D. J., Vernon, S. M.

MRS-Materials Research Society
9 国際会議録 Evolution of Electronic Properties of Cu(In,Ga)Se2 (CIGS)-Based Solar Cells During a 3-Stage Growth Process

AbuShama, Jehad A., Johnston, S., Ahrenkiel, R., Crandall, R., Young, D., Noufi , R.

Materials Research Society
4 国際会議録 Characterization of a Dominant Electron Trap in GaNAs Using Deep-Level Transient Spectroscopy

Johnston, Steven W., Kutz, Sarah R., Crandall, Richard S.

Materials Research Society
10 国際会議録 Comparison of Silicon Photoluminescence and Photoconductive Decay for Material Quality Characterization

Steven Johnston, Richard Ahrenkiel, Pat Dippo, Matt Page, Wyatt Metzger

Materials Research Society
5 国際会議録 Domain Structure and Transient Photoconductivity in Ordered Ga0.47In0.53As Epitaxial Films

Ahrenkiel, S. P., Ahrenkiel, R. K., Arent, D. J.

MRS - Materials Research Society
11 国際会議録 Diffusion and Electrical Properties of 3d Transition-Metal Impurity Series in Silicon

Nakashima,H., Sadoh,S., Kitagawa,H., Hashimoto,K.

Trans Tech Publications
6 国際会議録 *THE HETEROEPITAXY AND CHARACTERIZATION OF InP AND GaInP ON SILICON FOR SOLAR CELL APPLICATIONS

Al-Jassim, M. M., Ahrenkiel, R. K., Wanlass, M. W., Olson, J. M., Vernon, S. M.

Materials Research Society
12 国際会議録 Thick Bonded Silicon-On-Insulator Wafer with Polysilicon Interlayer for Gettering of Metal Impurities

J. Hintsala, J. Mäkinen, S. Whiston, P. Daly, K. Nunan

Electrochemical Society
1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12