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The Incorporation and Complex Formation of Ag Acceptors in CdTe

著者名:
Wolf, H.
Filz, T.
Hamann, J.
Ostheimer, V.
Lany, S.
Wichert, Th.
Deicher, M.
Burchard, A.
Collaboration, The Isolde
さらに 4 件
掲載資料名:
Defect and impurity engineered semiconductors, II : symposium held April 13-17, 1998, San Francisco, California, U.S.A.
シリーズ名:
Materials Research Society symposium proceedings
シリーズ巻号:
510
発行年:
1998
開始ページ:
337
出版情報:
Warrendale, Pa: MRS - Materials Research Society
ISSN:
02729172
ISBN:
9781558994164 [1558994165]
言語:
英語
請求記号:
M23500/510
資料種別:
国際会議録

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