Blank Cover Image

Evaluation of GaP States in Hydrogen-Terminated Silicon Surfaces and Ultrathin SiO2/Si Interfaces by Using Photoelectron Yield Spectroscopy

著者名:
Miyazaki, S.
Tamura, T.
Maruyama, T.
Murakami, H.
Kohno, A.
Hirose, M.
さらに 1 件
掲載資料名:
Electrically based microstructural characterization II : symposium held December 1-4, 1997, Boston, Massachusetts, U.S.A.
シリーズ名:
Materials Research Society symposium proceedings
シリーズ巻号:
500
発行年:
1998
開始ページ:
81
出版情報:
Warrendale, PA: MRS - Materials Research Society
ISSN:
02729172
ISBN:
9781558994058 [155899405X]
言語:
英語
請求記号:
M23500/500
資料種別:
国際会議録

類似資料:

1 国際会議録 Electronic Density of States at the Ultrathin SiO2/Si Interfaces

Hirose, M., Alay, J.L., Yoshida, T., Miyazaki, S.

Electrochemical Society
7 国際会議録 INFRARED SPECTRA OF ULTRA-THIN SiO2 GROWN ON Si SURFACES

Yamazaki, T., Miyazaki, S., Bjorkman, C. H., Fukuda, M., Hirose, M.

MRS - Materials Research Society
2 国際会議録 STRUCTURAL AND ELECTRICAL CHARACTERIZATION OF ULTRA-THIN SiO2 GROWN ON HYDROGEN-TERMINATED SILICON SURFACES

Hirose, M., Yasaka, T., Hiroshima, M., Takakura, M., Miyazaki, S.

MRS - Materials Research Society
8 国際会議録 Surface and Interface Structures of Ultrathin Silicon Oxynitride Films

Takahashi, K., Inoue, K., Kato, H., Tamura, N., Hikazutani, K., Sano, S., Hattori, T.

Electrochemical Society
3 国際会議録 INITIAL STAGE OF SiO2/Si INTERFACE FORMATION ON HYDROGEN-TERMINATED SILICON SURFACES

Hattori, T., Nohira, H., Ohishi, K., Shimizu, Y., Tamura, Y.

MRS - Materials Research Society
9 国際会議録 Band Gap of Luminescent Porous Silicon

Murayama, K., Komatsu, H., Miyazaki, S., Hirose, M.

Electrochemical Society
4 国際会議録 CHEMICAL STRUCTURE OF NATIVE OXIDE GROWN ON HYDROGEN-TERMINATED SILICON SURFACES

Takakura, M., Yasaka, T., Miyazaki, S., Hirose, M.

Materials Research Society
10 国際会議録 *SURFACE PROCESSES IN LASER-INDUCED ETCHING OF SILICON STUDIES BY X-RAY PHOTOELECTRON SPECTROSCOPY

Hirose, M., Ogura, T.

Materials Research Society
5 国際会議録 Influence of BHF Treatments on Hydrogen-Terminated Si(100) Surfaces

Osada, T., Kawazawa, Y., Miyazaki, S., Hirose, M.

MRS - Materials Research Society
11 国際会議録 Profiling of the SiO2 - SiC Interface Using X-ray Photoelectron Spectroscopy

Ghosh, R.N., Ezhilvalavan, S., Golding, B., Mukhopadhyay, S.M., Mahadev, N., Joshi, P., Das, M.K., Cooper, J.A., Jr.

Materials Research Society
6 国際会議録 Valence Band Alignment of Ultra-Thin SiO2/Si Interfaces as Determined by High Resolution X-ray Photoelectron Spectroscopy

Alay, J. L., Fukuda, M., Bjorkman, C. H., Nakagawa, K., Sasaki, S., Yokoyama, S., Hirose, M.

MRS - Materials Research Society
12 国際会議録 High-resolution photoelectron yield spectroscopy of oxide superconductors

Kawasaki,M., Ohashi,S., Kitajima,T., Gonda,S., Kanda,N., Tsuchiya,R., Kishio,K., Koinuma,H.

SPIE-The International Society for Optical Engineering
1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12