A Technique for the Measurement of d31 Coefficient of Piezoelectric Thin Films
- 著者名:
- 掲載資料名:
- Materials for smart systems II : sympsoium held December 2-5, 1996, Boston, Massachusetts, U.S.A.
- シリーズ名:
- Materials Research Society symposium proceedings
- シリーズ巻号:
- 459
- 発行年:
- 1997
- 開始ページ:
- 225
- 出版情報:
- Pittsburgh, PA: MRS - Materials Research Society
- ISSN:
- 02729172
- ISBN:
- 9781558993631 [1558993630]
- 言語:
- 英語
- 請求記号:
- M23500/459
- 資料種別:
- 国際会議録
類似資料:
MRS - Materials Research Society |
7
国際会議録
The Impact of Domains on the Dielectric and Electromechanical Properties of Ferroelectric Thin Films
MRS - Materials Research Society |
MRS - Materials Research Society |
MRS - Materials Research Society |
3
国際会議録
AC and DC Electrical Stress Reliability of Piezoelectric Lead Zicronate Titanate(PZI)Thin Films
SPIE - The International Society for Optical Engineering |
Materials Research Society |
MRS - Materials Research Society |
10
国際会議録
Structural and dielectric properties of pulsed laser deposited Pb[Yb1/2Nb1/2]O3-PbTiO3 thin films
MRS-Materials Research Society |
MRS - Materials Research Society |
MRS-Materials Research Society |
MRS - Materials Research Society |
12
国際会議録
Hard and Soft Composition Lead Zirconate Titanate Thin Films Deposited by Pulsed Laser Deposition
MRS - Materials Research Society |