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Optical Characterization of AlxGa1-xSb/GaSb Epitaxial Layers

著者名:
Lernia, S. di
Geddo, M.
Guizzetti, G.
Patrini, M.
Bosacchi, A.
Franchi, S.
Magnanini, R.
さらに 2 件
掲載資料名:
Diagnostic techniques for semiconductor materials processing II : symposium held November 27-30, 1995, Boston, Massachusetts, U.S.A.
シリーズ名:
Materials Research Society symposium proceedings
シリーズ巻号:
406
発行年:
1996
開始ページ:
389
出版情報:
Pittsburgh, Pa.: MRS - Materials Research Society
ISSN:
02729172
ISBN:
9781558993099 [1558993096]
言語:
英語
請求記号:
M23500/406
資料種別:
国際会議録

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