Incorporation of Hydrogen in SiO2 and Si3N4 Thin Films Deposited by ECR-CVD
- 著者名:
Brown, J. Boudreau, M. Boumerzoug, M. Mascher, P. Jackman, T. E. Tong, S. Y. Haugen, H. - 掲載資料名:
- Defect and impurity engineered semiconductors and devices : symposium held April 17-21, 1995, San Francisco, California, U.S.A.
- シリーズ名:
- Materials Research Society symposium proceedings
- シリーズ巻号:
- 378
- 発行年:
- 1995
- 開始ページ:
- 1037
- 出版情報:
- Pittsburgh, PA: MRS - Materials Research Society
- ISSN:
- 02729172
- ISBN:
- 9781558992818 [1558992812]
- 言語:
- 英語
- 請求記号:
- M23500/378
- 資料種別:
- 国際会議録
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9
国際会議録
Erbium doped silicon rich silicon oxide luminescent thin films deposited by ECR-PECVD [5970-118]
SPIE - The International Society of Optical Engineering |
Society of Vacuum Coaters |
MRS - Materials Research Society |
MRS - Materials Research Society |
Electrochemical Society |
MRS - Materials Research Society |
Electrochemical Society |