Blank Cover Image

Resonant measurement techniques using backward wave oscillators

著者名:
掲載資料名:
Millimeter and Submillimeter Waves IV : 20-23 July 1998, San Diego, California
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
3465
発行年:
1998
開始ページ:
218
終了ページ:
226
出版情報:
Bellingham, Wash., USA: SPIE
ISSN:
0277786X
ISBN:
9780819429209 [0819429201]
言語:
英語
請求記号:
P63600/3465
資料種別:
国際会議録

類似資料:

Dayton, J. A. Jr., Kory, C. L., Mearini, G. T.

SPIE - The International Society of Optical Engineering

B. Levush, T.M. Antonsen, Jr., A. Vlasov, G.S. Nusinovich, S.M. Miller

Society of Photo-optical Instrumentation Engineers

B.-L. Qian, C.-L. Li, Y.-G. Liu

Society of Photo-optical Instrumentation Engineers

Grabowski,C., Gahl,J.M., Schamiloglu,E., Fleddermann,C.B.

SPIE-The International Society for Optical Engineering

Gruner G.

Plenum Press

Chernyavsky,I.A., Pikunov,V.M.

SPIE - The International Society for Optical Engineering

Gruner,G.

Kluwer Academic Publishers

Sollner G. L. C. T., Brown R. E., Soderstrom R. J., McGill C. T., Parker D. C., Goodhue D. W.

Plenum Press

Hahn,K., Fuks,M.I., Schamiloglu,E.

SPIE-The International Society for Optical Engineering

E.V. Ilyakov, N.I. Zaitsev, G.S. Korablyov, I.S. Kulagin

Society of Photo-optical Instrumentation Engineers

Phillips, P., Ives, R.L., Kory, C., Read, M., Neilson, J., Caplan, M., Chubun, N., Schwartzkopf, S., Witherspoon, R.

SPIE - The International Society of Optical Engineering

H. Yuan, X. Ge, C. Zhang

Society of Photo-optical Instrumentation Engineers

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12