Effects of processing conditions on PbGeTe film performance
- 著者名:
Zhang,S. ( Shanghai Institute of Technical Physics (China) ) Cheng,C. ( Shanghai Nicera Sensor Co.,Ltd. (China) ) Ling,J. ( Shanghai Nicera Sensor Co.,Ltd. (China) ) Fan,B. ( Shanghai Institute of Technical Physics (China) ) Zou,Z. ( Shanghai Institute of Testing Technology (China) ) Wang,Z. ( Shanghai Institute of Testing Technology (China) ) Zhang,J. ( Shanghai Institute of Testing Technology (China) ) Shi,T. ( Shanghai Institute of Mrtallurgy (China) ) Wang,G. ( Shanghai Institute of Mrtallurgy (China) ) - 掲載資料名:
- Third International Conference on Thin Film Physics and Applications : 15-17 April 1997, Shanghai, China
- シリーズ名:
- Proceedings of SPIE - the International Society for Optical Engineering
- シリーズ巻号:
- 3175
- 発行年:
- 1998
- 開始ページ:
- 429
- 終了ページ:
- 432
- 出版情報:
- Bellingham, Wash.: SPIE-The International Society for Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819426734 [0819426733]
- 言語:
- 英語
- 請求記号:
- P63600/3175
- 資料種別:
- 国際会議録
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