Mobile charge testing of sodium-contaminated thermal oxides using corona temperature stressing
- 著者名:
- Hoff,A.M. ( Univ.of South Florida )
- DeBusk,D.K. ( Cirent Semiconductor )
- 掲載資料名:
- In-Line Characterization Techniques for Performance and Yield Enhancement in Microelectronic Manufacturing
- シリーズ名:
- Proceedings of SPIE - the International Society for Optical Engineering
- シリーズ巻号:
- 3215
- 発行年:
- 1997
- 開始ページ:
- 26
- 終了ページ:
- 34
- 出版情報:
- Bellingham, Wash.: SPIE-The International Society for Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819426475 [0819426474]
- 言語:
- 英語
- 請求記号:
- P63600/3215
- 資料種別:
- 国際会議録
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