Blank Cover Image

Versatile electronic speckle pattern interferometry

著者名:
Sirohi,R.S. ( National Univ.of Singapore )  
掲載資料名:
Laser interferometry IX : techniques and analysis : 20-21 July 1998, San Diego, California
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
3478
発行年:
1998
開始ページ:
417
終了ページ:
420
出版情報:
Bellingham, Wash.: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819429339 [0819429333]
言語:
英語
請求記号:
P63600/3478
資料種別:
国際会議録

類似資料:

1 国際会議録 Compensation techniques in speckle interferometry

Sirohi,R.S., Gupta,B.N.

SPIE - The International Society for Optical Engineering
7 国際会議録 Speckle shear photography using photorefractive crystals for in-plane strain measurement

Majles Ara, M.H., Sirohi, R.S.

SPIE-The International Society for Optical Engineering
2 国際会議録 Engineering applications of speckle phenomenon

Sirohi,R.S.

SPIE - The International Society for Optical Engineering
8 国際会議録 Collimation testing techniques:a review

Sirohi,R.S.

SPIE - The International Society for Optical Engineering
3 国際会議録 Nondestructive evaluation of fiber-reinforced polymer composites by an all-fiber-optic phase-shifting electronic speckle pattern interferometer

Murukeshan,V.M., Ganesan,A.R., Sirohi,R.S., Malhotra,S.K.

SPIE-The International Society for Optical Engineering
9 国際会議録 Vector sensing with electronic fiber speckle pattern interferometry [5911-24

Wang, B., Fu, J. Y., Liu, Y., Guo, R., Yin, S.

SPIE - The International Society of Optical Engineering
4 国際会議録 Double shear speckle interferometry for curvature measurement

Ganesan,A.R., Murukeshan,V.M., Meinlschmidt,P., Sirohi,R.S.

SPIE-The International Society for Optical Engineering
10 国際会議録 Electronic Speckle Pattern Interferometry

Lokberg J. O.

Martinus Nijhoff Publishers
5 国際会議録 Improvements on Electronic Speckle Pattern Interferometry

Soares D. D. O., Lage S. V. L. A., Sakowski H.

Martinus Nijhoff Publishers
11 国際会議録 Polarization phase shifting in white-light interferometry

Helen,S.Suja, Kothiyal,M.P., Sirohi,R.S.

SPIE - The International Society for Optical Engineering
6 国際会議録 Fourier plane filters and common path interferometry in vibrometers and electronic speckle interferometers

Kitchen,S.R., Hanson,S.G., Hansen,R.S.

SPIE-The International Society for Optical Engineering
12 国際会議録 Spectrally resolved white-light interferometry for profilometry with polarization phase shifter

Helen,S.Suja, Kothiyal,M.P., Sirohi,R.S.

SPIE - The International Society for Optical Engineering
1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12