Blank Cover Image

In Line Monitoring of Poly(ethylene vinyl acetate) Extrusion Process Using Fiber Optic Raman Spectroscopy

著者名:
掲載資料名:
ANTEC 2000 Conference proceedings, May 7-11, 2000, Orlando, Florida
シリーズ名:
Annual Technical Conference - ANTEC : Society of Plastics Engineers Annual Technical Papers
シリーズ巻号:
46
発行年:
2000
パート:
2
開始ページ:
1742
終了ページ:
1745
総ページ数:
4
出版情報:
Brookfield Center, CT: Society of Plastics Engineers, Inc. (SPE)
ISBN:
9781566768559 [1566768551]
言語:
英語
請求記号:
S42700/46
資料種別:
国際会議録

類似資料:

Deshpande J. B., Dhamdhere S. M., Li J., Hansen G. M.

Society of Plastics Engineers, Inc. (SPE)

Rogalski, M. E., Hansen, M. G.

Society of Plastics Engineers, Inc. (SPE)

Batra, J., Hansen, M. G.

Society of Plastics Engineers, Inc. (SPE)

Shim,M.G., Wilson,B.C., Marple,E., Wach,M.L.

SPIE-The International Society for Optical Engineering

Barnes, S.E., Sibley, M.G., Brown, E.C., Coates, P., Scowen, I.J., Edwards, H.G.

Society of Plastics Engineers

Dollinger, Harli M., Sawan, Samuel P.

American Chemical Society

Khettry A., Hansen G. M.

Society of Plastics Engineers, Inc. (SPE)

Vedula S., Hansen G. M.

Society of Plastics Engineers, Inc. (SPE)

Li, J., Hansen, G.

Society of Plastics Engineers, Inc. (SPE)

Schulze,H.G., Greek,L.S., Blades,M.W., Bree,A.V., Gorzalka,B.B., Turner,R.F.B.

SPIE-The International Society for Optical Engineering

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12