Impact Test with Flat-Ended Impactor for Protective Materials: Specimen Thickness Effect

Impact Test with Flat-Ended Impactor for Protective Materials: Specimen Thickness Effect

著者名:

Kim, H. S. ( University of Massachusetts at Amherst )
Shafig, R. M. ( GE Corporate Research and Development )

掲載資料名:

ANTEC 2000 Conference proceedings, May 7-11, 2000, Orlando, Florida

シリーズ名:

Annual Technical Conference - ANTEC : Society of Plastics Engineers Annual Technical Papers

シリーズ巻号:

46

発行年:

2000

パート:

2

開始ページ:

1499

終了ページ:

1503

総ページ数:

5

出版情報:

Brookfield Center, CT: Society of Plastics Engineers, Inc. (SPE)

ISBN:

9781566768559 [1566768551]

言語:

英語

請求記号:

S42700/46

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00021094
シリーズID:	PA00000030
会議名:	ANTEC 2000 : Annual Technical Conference
回次:	58th
会議開催地:	Orlando, FL, USA
会議開催年:	2000.05.07-2000.05.11
論文注記:	ENGINEERING PROPERTIES AND STRUCTURE DIVISION

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