Design of a compact 3D laser scanner

Design of a compact 3D laser scanner

著者名:

Geusen,M. ( Stan Ackermans Institute(Netherlands)and Philips Ctr.for Manufacturing Technology )
Amstel,W.D.van
Baumer,S.M.B.
Horijon,J.L.

掲載資料名:

Design and engineering of optical systems II : 25-27 May 1999, Berlin, Germany

シリーズ名:

Proceedings of SPIE - the International Society for Optical Engineering

シリーズ巻号:

3737

発行年:

1999

開始ページ:

252

終了ページ:

260

出版情報:

Bellingham, WA: SPIE - The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819432117 [0819432113]

言語:

英語

請求記号:

P63600/3737

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00016681
シリーズID:	PA00000029
会議名:	SPIE Optical Systems Design : Design and engineering of optical systems
回次:	1999 : 2nd
会議開催地:	Berlin, Germany
会議開催年:	1999.05.25-1999.05.27

類似資料:

1 国際会議録 Optical figure testing by scanning deflectometry Amstel,W.D.van, Baumer,S.M.B., Horijon,J.L. SPIE - The International Society for Optical Engineering	7 国際会議録 Principles of the ideal scanner model:an analytical theory of the banana mirror system Amstel,W.D.van SPIE - The International Society for Optical Engineering
2 国際会議録 Large-scale high-resolution 3D laser scanner for solder-paste inspection Horijon,J.L., Couweleers,F.C., Amstel,W.D.van SPIE-The International Society for Optical Engineering	8 国際会議録 Minideflectometer for measuring optical finish quality van Amstel,W.D., Baumer,S.M.B., Couweleers,F.C. SPIE - The International Society for Optical Engineering
3 国際会議録 Optical figure testing by scanning deflectometry van Amstel,W.D., Baumer,S.M.B., Horijon,J.L. SPIE - The International Society for Optical Engineering	9 国際会議録 A Bayesian approach to filter design: detection of compact sources Lopez-Caniego, M., Herranz, D., Barreiro, R.B., Sanz, J.L. SPIE - The International Society of Optical Engineering
4 国際会議録 Optical system of an industrial 3D laser scanner for solder paste inspection J.L. Horijon, W.D. van Amstel, F.C. Couweleers, W.C.M. Ligthart Society of Photo-optical Instrumentation Engineers	10 国際会議録 Design of illumination system for ArF excimer laser step-and-scanner Lee,K.H., Kim,D.H., Kim,J.S., Choi,S.-S., Chung,H.B., Yoo,H.J., Kim,B.W. SPIE-The International Society for Optical Engineering
5 国際会議録 Optical testing of long cylindrical lenses by means of scanning deflectometry Amstel,W.D.van, Goor,P.F.A.van de, Horijon,J.L., Nuyens,P.G.J.M. SPIE-The International Society for Optical Engineering	11 国際会議録 A compact 3D imaging laser radar system using Geiger-mode APD arrays: system and measurements Marino, R.M., Stephens, T., Hatch, R.E., McLaughlin, J.L., Mooney, J.G., O'Brien, M.E., Rowe, G.S., Adams, J.S., Skelly, … SPIE-The International Society for Optical Engineering
6 国際会議録 Principles of the ideal scanner model:an analytical theory of the banana mirror system Amstel,W.D.van SPIE - The International Society for Optical Engineering	12 国際会議録 Ultrahigh-resolution CT and DR scanner DiBianca, F.A., Gupta, V., Zou, P., Jordan, L.M., Laughter, J.S., Zeman, H.D., Sebes, J.l. SPIE - The International Society of Optical Engineering

1

2

3

4

5

6

7

8

9

10

11

12