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Principles of the ideal scanner model:an analytical theory of the banana mirror system

著者名:
Amstel,W.D.van ( Philips Ctr.for Manufacturing Technology )  
掲載資料名:
Design and engineering of optical systems II : 25-27 May 1999, Berlin, Germany
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
3737
発行年:
1999
開始ページ:
241
終了ページ:
251
出版情報:
Bellingham, WA: SPIE - The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819432117 [0819432113]
言語:
英語
請求記号:
P63600/3737
資料種別:
国際会議録

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