Development of standards for characterization of cathodoluminescence efficiency
- 著者名:
- Shea,L.E. ( Sandia National Labs. )
- Walko,R.J.
- 掲載資料名:
- Flat panel display technology and display metrology : 27-29 January 1999, San Jose, California
- シリーズ名:
- Proceedings of SPIE - the International Society for Optical Engineering
- シリーズ巻号:
- 3636
- 発行年:
- 1999
- 開始ページ:
- 105
- 終了ページ:
- 115
- 出版情報:
- Bellingham, Wash.: SPIE - The International Society for Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819431073 [0819431079]
- 言語:
- 英語
- 請求記号:
- P63600/3636
- 資料種別:
- 国際会議録
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