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Development of standards for characterization of cathodoluminescence efficiency

著者名:
掲載資料名:
Flat panel display technology and display metrology : 27-29 January 1999, San Jose, California
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
3636
発行年:
1999
開始ページ:
105
終了ページ:
115
出版情報:
Bellingham, Wash.: SPIE - The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819431073 [0819431079]
言語:
英語
請求記号:
P63600/3636
資料種別:
国際会議録

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